FastScan is a powerful tool for Automaic Test Pattern Genertaion (ATPG). As ASIC designs grow in complexity and shrink in feature size, additional test challenges emerge. FastScan meets these challenges and sets the standard for the highest quality and the most efficient test sets for today’s ASIC designs.

FastScan offers all the features needed to generate high coverage, compact test sets quickly, with just a single command. For the power user, FastScan has been proven to offer the flexibility and features needed to deliver exceptional results on the most complex multi-million gate designs.

With its wide range of fault models, comprehensive design rules checks, extensive clocking support, and innovative algorithms for performance-oriented pattern compaction, FastScan leads the industry.

Additional features include:

• Advanced at-speed test capabilities for defect detection
• Innovative compression techniques to generate compact test sets
• Extensive fault model support, including stuck-at, IDDQ, transition and path delay
• On-chip PLL support for accurate at-speed test
• Comprehensive design rules checking to identify testability problems early