Calibre circuit verification accurately and efficiently addresses functional yield challenges in today's IC designs. The industry-leading Calibre nmLVS tool ensures accurate circuit behavior with precise device parameters, while parasitic extraction tools provide the accurate and high-performance extraction required for all design styles.
Calibre reliability verification ensures designs are protected against early device failure and long-term performance degradation. A novel logic-driven layout analysis combines schematic and layout parameters for precise, accurate analysis of complex reliability concerns not possible with traditional verification tools.
Circuit & Reliability Verification
Calibre circuit verification delivers fast, efficient layout vs schematic and parasitic extraction solutions to ensure circuits will be successful when manufactured. Design verification helps ensure the robustness of a design and reduce susceptibility to premature or catastrophic electrical failures by considering the context of schematic and layout information. Designers rely on the accuracy of Calibre predictions for silicon performance and reliability to achieve first-time product success.
The Calibre nmLVS platform delivers high performance layout vs schematic verification, electrical rule checking, and advanced parameter calculation to validate circuit integrity and accuracy.
The Calibre PERC platform is the industry leader for reliability verification solutions, enabling a vast range of IC circuit reliability checks not possible with traditional verification tools.
The Calibre xACT tool delivers reference level accuracy for leading edge FinFET, custom, analog, and RF designs, with performance and capacity for multi-million instance digital designs.
The Calibre xRC parasitic extraction tool delivers accurate parasitic data for comprehensive and accurate post-layout analysis and simulation. Foundry-qualified for practically every process and node.
The Calibre xL tool delivers fast, accurate full chip frequency dependent loop inductance and loop resistance extraction that highly correlates with field solvers and provides silicon-tested accuracy.